UNE-EN IEC 60749-18:2019 PDF Download
Standard EN Sample
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Also Known As:
SKU179757351
Published by
Asociación Española de Normalización
AENOR
Publication Date2019-07-01
Pages CountPages29
Details
| ICS Codes | 31.080.01 - Semiconductor devices in general |
| Language(s) | English |
| File Size | 2.7 MB |
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